Tôi có một ổ đĩa mới và tôi bối rối nếu smartctl
phát hiện các thành phần xấu hay không. Cả hai bài kiểm tra tự ngắn và mở rộng completed without error
. Nhưng Error Log
chỉ ra Uncorrectable error in data
cho 96 sectors
.
Đây là smartctl
đầu ra:
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-52-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar T7K500
Device Model: Hitachi HDT725025VLA380
Serial Number: VFL104R73X993Z
LU WWN Device Id: 5 000cca 316f723ca
Firmware Version: V5DOA73A
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Wed Feb 5 19:19:29 2014 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4949) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 83) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 110 110 024 Pre-fail Always - 338 (Average 340)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1838
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 11746
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1822
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 2103
193 Load_Cycle_Count 0x0012 099 099 000 Old_age Always - 2103
194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 12/48)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 27 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 27 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:28:22.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:28:22.200 SET FEATURES [Set transfer mode]
Error 26 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:28:11.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:28:11.200 SET FEATURES [Set transfer mode]
Error 25 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:28:00.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:28:00.200 SET FEATURES [Set transfer mode]
Error 24 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:27:49.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:27:49.200 SET FEATURES [Set transfer mode]
Error 23 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:27:38.900 READ DMA EXT
25 03 08 7c a8 3a 40 00 02:27:38.900 READ DMA EXT
35 03 08 7c a8 3a 40 00 02:27:38.900 WRITE DMA EXT
25 03 08 7c a8 3a 40 00 02:27:38.900 READ DMA EXT
25 03 08 a4 eb 94 40 00 02:27:38.900 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 11746 -
# 2 Short offline Completed without error 00% 11744 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Và đây là một ảnh chụp màn hình với Error Log
:
Vậy chuyện gì đang xảy ra thế? Ổ đĩa có thành phần xấu hay không?
CẬP NHẬT1:
Để chắc chắn tôi cũng đã sử dụng badblocks
như được đề xuất trong Làm thế nào để bạn sử dụng badblocks? .
Đầu tiên, phương pháp chỉ đọc không phá hủy, dài 1h:
root@xubuntu:/home/xubuntu# badblocks -sv /dev/sda
Checking blocks 0 to 244198583
Checking for bad blocks (read-only test): done
Pass completed, 0 bad blocks found. (0/0/0 errors)
Và sau đó là phương pháp viết dài 10h (sử dụng cẩn thận!):
root@xubuntu:/home/xubuntu# badblocks -wsv /dev/sda
Checking for bad blocks in read-write mode
From block 0 to 244198583
Testing with pattern 0xaa: done
Reading and comparing: done
Testing with pattern 0x55: done
Reading and comparing: done
Testing with pattern 0xff: done
Reading and comparing: done
Testing with pattern 0x00: done
Reading and comparing: done
Pass completed, 0 bad blocks found. (0/0/0 errors)
Như được đề xuất trong các câu trả lời, nó thực sự không giống như có các thành phần xấu trên ổ cứng này. (Vâng!)
smartctl
và trên mọi đĩa tôi đã từng có (hoặc đã ở trong một hệ thống mà tôi quản lý hoặc đã từng được yêu cầu giúp khắc phục) mà không có vấn đề gì, nó đã bằng không. Đôi khi, tôi đã có một đĩa phát triển một số trong số chúng do mất điện khiến cho khu vực bị hỏng, nhưng không phải là xấu về mặt vật lý, trong trường hợp đó, chỉ đơn giản là ghi đè lên nó với dữ liệu tốt đã trả về số lượng đang chờ xử lý về 0 và đã bỏ đi số phân bổ lại còn lại ở mức không.